Call for Papers: IOLTS 2025

The 31st IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) will take place from July 7 to July 9, 2025, in Ischia, Italy at the Continental Ischia Hotel & SPA.

IOLTS is a forum for presenting novel ideas and experimental data on Online Testing techniques and, more generally, to Design for Robustness, Design for Reliability, and Design for Security.

Topics of Interest (not limited to)

• Dependable system design
• Dependable Computer Architectures
• Design-for-Reliability
• Design for Reliability approaches for Low-Power
• Cross-layer reliability approaches
• Fault-Tolerant and Fail-Safe systems
• Functional safety
• Self-Test and Self-Repair
• Self-Healing design
• Self-Regulating design
• Self-Adapting design
• Reliability issues of Low-Power Design
• Robustness evaluation
• Quality, yield, reliability, and lifespan issues in nanometer technologies
• Variability, Aging, EMI, and Radiation Effects in nanometer technologies
• On-line testing techniques for digital, analog, and mixed-signal circuits
• Self-checking circuits and coding theory
• On-line monitoring of current, temperature, process variations, and aging
• Power density and overheating issues in nanometer technologies
• Field Diagnosis, Maintainability, and Reconfiguration
• Design for Security
• Fault-based attacks and countermeasures
• Design for Robustness for automotive, railway, avionics, space, large industrial applications, IT infrastructure, cloud computing, and wired, cellular, and satellite communications
• CAD for robust circuits design

Important Dates

• Submission of title, abstract, and authors: March 9, 2025
• Final Paper Submission: March 16, 2025
• Author Notification: April 30, 2025
• Camera-ready paper and author registration: May 31, 2025
• Conference Dates: July 7 - 9, 2025

Submission

• Paper submission
• Presenters Guidelines
• Camera Ready preparation
• Download the Call for Paper

Publication

The best accepted papers of IOLTS 2025 will be invited to submit extended versions for an IEEE Transactions on Device and Materials Reliability (TDMR) special issue dedicated to IOLTS 2025.

Contacts

• Angeliki Kritikakou: angeliki.kritikakou@irisa.fr
• Marcello Traiola: marcello.traiola@inria.fr
• Ioana Vatajelu: ioana.vatajelu@univ-grenoble-alpes.fr
• Riccardo Cantoro: riccardo.cantoro@polito.it