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5月26日 - 2025年5月30日

排名: TBR (CORE2023)Offline

IEEE European Test Symposium

更新于:about 2 months ago
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Tallinn, ESTONIAIEEE Computer Society

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概览

The 30th IEEE European Test Symposium (ETS), Europe's premier forum for testing, reliability, safety, security, and validation of electronic-based circuits and systems, will be held from May 26-30, 2025, in Tallinn, Estonia. Organized by Tallinn University of Technology (TalTech) and technically co-sponsored by IEEE Computer Society and IEEE Council on Electronic Design Automation (CEDA), ETS 2025 celebrates its 30th anniversary and will feature scientific papers, industrial case-studies, student activities, and workshops.

论文征集

Call for Regular/Research Papers

The 30th IEEE European Test Symposium (ETS 2025) is Europe's premier forum dedicated to presenting and discussing scientific results, emerging ideas, hot topics, and new trends, as well as industrial case-studies and applications in the area of electronic-based circuits and systems testing, reliability, safety, security, and validation.

The symposium will take place in Tallinn, Estonia, from May 26 - 30, 2025. This year marks the 30th Anniversary edition of ETS.

ETS'25 will produce Formal Proceedings of scientific papers with an ISBN number, which will be indexed by the IEEE Xplore Digital Library. An Informal Digest will also collect contributions in other categories with an open access on-line archiving option.

Submission Guidelines

  • Format: Each submitted paper should be a complete PDF manuscript, up to six (6) pages (inclusive of all figures, tables, and bibliography) in a standard IEEE format (A4 pages, two columns, single spaced, 10 points Times New Roman font). IEEE template and guidelines can be found here.
  • Review Process: ETS implements a single-blind review process (authors do not know reviewers, but reviewers know authors). Submissions should not be anonymized.
  • Commitment: A submission of a scientific paper is a commitment that, upon acceptance, authors will submit their camera-ready version for inclusion in the formal proceedings and will present the paper (or the poster) at the symposium. Full 6-page papers are for oral presentation, while a short 4-page paper implies a poster presentation.
  • Plagiarism: Authors are expected to follow the IEEE Submission and Peer Review Policies, including the latest Policy on plagiarism and Guidelines for AI generated text, which can be found here.

Key Dates for Regular/Research Papers

  • Submission of title, abstract, authors: December 1, December 9, 2024
  • Full paper submission: December 8, December 15, 2024 (AOE - Anywhere on Earth)
  • Notification of acceptance: February 14, 2025
  • Camera-ready manuscript: March 14, 2025
  • Author registration: March 31, 2025

Submission Website

Submissions should be made electronically as a single PDF file via: https://welcome.molesystems.com/tttc/ETS/2025

Topic Areas for Submission

  • T1 – Dependable AI and AI for Testing
  • T2 – Functional Safety, Fault Tolerance and Reliability
  • T3 – Methods for Emerging Technologies and Architectures
  • T4 – Security and Trust
  • T5 – Test and Reliability for Analog, Mixed-Signal, and RF
  • T6 – DFT, Test Access Standards and Test Application
  • T7 – Validation, Verification, and Debug
  • T8 – Test Generation, Fault Modeling & Simulation, Diagnosis

Contact Information

General Chairs:

Program Chairs:

Download Call for Papers PDF

重要日期

会议日期

Conference Date

2025年5月26日2025年5月30日

投稿

Submission of title, abstract, authors

2024年12月9日

Full paper submission

2024年12月15日

通知

Notification of acceptance

2025年2月14日

终稿

Camera-ready manuscript

2025年3月14日

来源排名

来源: CORE2023

排名: TBR

研究领域: Computer Systems Engineering, 已不再使用

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